 |
|
|
 |
|
CAMECA, SAS
29 Quai des Gresillons
Gennevilliers Cedex, 92622
France
Phone: 33 1 43 34 62 00
Website: http://www.cameca.com/
Email: gennev@cameca.fr
Secondary Ion Mass Spectrometer (SIMS), Electron Probe Microanalysis (EPMA), Low energy Electron induced X-ray Emission Spectrometry (LEXES) and Atom Probe Tomography (APT)
EDAX
91 McKee Drive
Mahwah, New Jersey 07432
United States
Phone: 201-529-4880
Fax: 201-529-3156
Website: http://www.edax.com/
Email: edax.sales@ametek.com
EDS and WDS X-ray microanalysis, electron backscatter diffraction (EBSD), crystallographic analysis, electron diffraction and Micro-EDXRF.
SPECTRO Analytical Instruments GmbH
Boschstr.10
Kleve, 47533
Germany
Phone: 49 2821 8 92 0
Fax: 49 2821 8 92 22 00
Website: http://www.spectro.com/
Email: spectro.info@ametek.com
Atomic spectroscopic instrumentation, optical emission or energy dispersive X-ray fluorescence (EDXRF) measurement techniques and inductively coupled plasma mass spectrometry.
|
|