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CAMECA, SAS
29 Quai des Gresillons
Gennevilliers Cedex, 92622
France
Phone: 33 1 43 34 62 00
Website: http://www.cameca.com/
Email: gennev@cameca.fr
Secondary Ion Mass Spectrometer (SIMS), Electron Probe Microanalysis (EPMA), Low energy Electron induced X-ray Emission Spectrometry (LEXES) and Atom Probe Tomography (APT
EDAX
91 McKee Drive
Mahwah, New Jersey 07432
United States
Phone: 201-529-4880
Fax: 201-529-3156
Website: http://www.edax.com/
Email: edax.sales@ametek.com
EDS and WDS X-ray microanalysis, electron backscatter diffraction (EBSD), crystallographic analysis, electron diffraction and Micro-EDXRF
other possibilities at AMETEK
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