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SIMS (Secondary Ion Mass Spectrometry):
• IMS 7f
• IMS 7f-Auto
• IMS Wf
• SC Ultra
• IMS 7f-GEO
• IMS 1280-HR
• NanoSIMS 50L
• SIMS 4550
• IMS 7fR
EPMA (Electron Probe MicroAnalysis):
• SXFive
• SXFive FE
• Shielded SX
LEXES (Low energy Electron induced X-ray Emission Spectrometry)
• Shallow Probe EX-300
APT (Atom Probe Tomography) :
• LEAP Si
• LEAP HR
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EDS X-ray Microanalysis
EBSD Crystallography
Wavelength Dispersive Spectroscopy
Integrated Materials Characterization
Micro X-ray Fluorescence
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Mobile & Portable Metal Analyzers
• SPECTRO iSORT
• SPECTRO xSORT
• SPECTROTEST
Stationary Metal Analyzers
• SPECTROMAXx
• SPECTROLAB
ICP-OES
• SPECTRO GENESIS
• SPECTROBLUE
• SPECTRO ARCOS
ICP-MS
• SPECTRO MS
EDXRF Spectrometers
• SPECTRO xSORT
• SPECTRO iQ II
• SPECTRO MIDEX
• SPECTRO XEPOS
• SPECTRO XEPOS HE
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Digital High-Speed Cameras
Phantom
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