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SIMS (Secondary Ion Mass Spectrometry):
• IMS 7f
• SC Ultra
• IMS Wf
• IMS 7f-GEO
• IMS 1280-HR
• NanoSIMS 50 and 50L
• SIMS 4550
• SIMS 4600
• IMS 7fR
EPMA (Electron Probe MicroAnalysis):
• SX 100
• SX 100R
LEXES (Low energy Electron induced X-ray Emission Spectrometry)
• Shallow Probe LEXFAB-300
APT (Atom Probe Tomography) :
• LA-WATAP
• LEAP Si
• LEAP HR
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EDS X-ray Microanalysis
EBSD Crystallography
Wavelength Dispersive Spectroscopy
Integrated Materials Characterization
Micro X-ray Fluorescence
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Mobile & Portable Metal Analyzers
• SPECTRO iSORT
• SPECTROTEST
Stationary Metal Analyzers
• SPECTROMAXx
• SPECTROLAB
ICP-OES
• SPECTRO GENESIS
• SPECTRO ARCOS 165
• SPECTRO ARCOS
ICP-MS
• SPECTRO MS
EDXRF Spectrometers
• SPECTRO xSORT
• SPECTRO iQ II
• SPECTRO MIDEX
• SPECTRO XEPOS
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Digital High-Speed Cameras
Phantom
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