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CAMECA, SAS
29 Quai des Gresillons
Gennevilliers Cedex, 92622
France
Phone: 33 1 43 34 62 00
Website: http://www.cameca.com/
Email: gennev@cameca.fr
Secondary Ion Mass Spectrometer (SIMS), Electron Probe Microanalysis (EPMA), Low energy Electron induced X-ray Emission Spectrometry (LEXES) and Atom Probe Tomography (APT)
SPECTRO Analytical Instruments GmbH
Boschstr.10
Kleve, 47533
Germany
Phone: 49 2821 8 92 0
Fax: 49 2821 8 92 22 00
Website: http://www.spectro.com/
Email: spectro.info@ametek.com
Atomic spectroscopic instrumentation, optical emission or energy dispersive X-ray fluorescence (EDXRF) measurement techniques and inductively coupled plasma mass spectrometry
Other possibilities at AMETEK
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