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SIMS: Secondary Ion Mass Spectrometry
EPMA: Electron Probe Micro-Analysis
LEXES: Low energy Electron induced X-ray Emission Spectrometry
APT (Atom Probe Tomography)
>> CAMECA Website
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EDS: Energy Dispersive Spectroscopy
WDS: Wavelength Dispersive Spectroscopy
EBSD: Electron Back Scatter Diffraction
Integrated: EDS, BSD and WDS
Micro-XRF: Mirco X-ray Flourescence
>>EDAX Website
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MMA: Mobile Metal Analysis
SMA: Stationary Metal Analysis
ICP-OES: Inductively Coupled Plasma Optical Emission Spectrometry
ICP-MS: Inductively Coupled Plasma Mass Spectrometry
EDXRF: Energy-dispersive X-ray Fluorescence Spectrometry
>>SPECTRO Website
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Proprietary CMOS sensor designs
High-throughput camera architecture
Embedded technology for image acquisition, analysis, storage and transport
High-throughput, high-capacity, removable memory magazines and docking station
>>VISION RESEARCH Website
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